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Home > Products > LCR/Impedance Analyzer > LCR Meters > LCR HiTESTER 3535

LCR HiTESTER 3535

  • |Z|, L, C, R testing
  • Testing source frequency: 100kHz to 120MHz
  • Measuring time: 6msec
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CATALOG

OVERVIEW

High-speed LCR meter with up to 120MHz sampling

High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development

  • Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
  • High speed LCR testing (6ms/sample)
  • 14 Parameter Types ( |Z|, |Y|, Θ, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q )
  • Detachable Head Amp
  • Load Compensation Function
  • BIN ( Classification ) Measurement

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